secondary ion
英 [ˈsekəndri ˈaɪən]
美 [ˈsekənderi ˈaɪən]
网络 二次离子; 次级离子; 次要离子; 次离子; 质量数
双语例句
- The technique, called secondary ion mass spectrometry, was developed to detect trace amounts of volatile gases such as chlorine and fluorine in Earth soil samples.
这项技术叫做次级离子质谱法（SIMS），本来是用来检测地球样土中氯、氟等微量挥发性气体的。 - Collection angle secondary ion mass spectroanalyzer
收集角-二次离子质谱术 - Study of Quantitative Analysis of Vanadium in SiC by Secondary Ion Mass Spectroscopy; any of several toxic or carcinogenic hydrocarbons that occur as impurities in herbicides.
二次离子质谱分析碳化硅中钒杂质含量的研究一些有毒或致癌的碳氢化合物，除草剂中的杂质。 - Testing method for oil separation of lubricating greases secondary ion mass spectrometry
润滑脂的油分离测定法次级离子质谱分析法 - Secondary ion mass spectrometry The five-category assets classification for bank loans
次级离子质谱分析法贷款质量五级分类办法 - Secondary ion mass spectrometry
次级离子质谱分析法 - Time-of-Flight secondary ion mass spectrometry ( TOF-SIMS) is a very sensitive surface analytical technique, well established for many industrial and research applications.
飞行时间二次离子质谱（TOF-SIMS）是一种非常灵敏的表面检测技术。 - Meanwhile, relative sensitive factor of secondary ion of implanted element can be obtained by this method.
由此方法还可得到稳定的、具有普遍意义的注入元素在基体中的二次离子相对灵敏度因子。 - Experimental Study about Oxygen Enhancement of Secondary Ion on The Metallic Surface versus ElectronegatiVity of Element
金属表面二次离子氧增强效应与元素电负性关系的实验研究 - Ion Microprobe Analysis of Silicate Minerals: Characteristics of the Secondary Ion Mass Spectrum
硅酸盐矿物的离子探针分析：二次离子质谱特征 - SIMS ( secondary ion mass spectrum) and variable temperature Hall measurement were employed to study the doping of Ag and the electrical properties of Ag doped HgCdTe films grown by LPE.
利用SIMS和变温霍尔测量手段对p型Hg0.77Cd0.23Te液相外延材料的Ag掺杂技术、机理及掺杂碲镉汞材料的性能进行了研究。 - The applications of static secondary ion mass spectrometry on polymer surface
静态二次离子质谱在聚合物表面研究中的应用 - The Application of Secondary Ion Mass Spectrometry to Analysis of Organic Compounds
二次离子质谱法在有机物分析中的应用 - Some New Devices and Instruments of Secondary Ion Mass Spectrometry
二次离子质谱法中的一些新装置和新仪器 - The oxygen effect on Ga+ secondary ion emission from GaAs with and without simultaneous Ar+ bombardment has been studied.
在有与没有Ar+同时轰击的条件下，研究了GaAs中Ga+2次离子发射的氧效应。 - Investigating progress of hydrogen release during plastic deformation and hydrogen diffusivity under high vacuum, hydrogen distribution in hulks and hydride formation at crack tips, hydrogen segregation at grain boundaries and quantitative hydrogen analysis have been presented using Secondary Ion Mass Spectroscopy ( SIMS).
本文介绍了二次离子质谱技术对于塑性形变过程中氢释放和高真空下氢扩散率，体内氢分布和裂尖氢化物形成，晶界氢偏析和定量氢分析等方面的研究进展。 - Secondary ion mass spectroscopic depth profile analysis of oxygen contamination in hydrogenated microcrystalline silicon
二次离子质谱深度剖面分析氢化微晶硅薄膜中的氧污染 - The enhanced adhesion of Cu films on Si substrates under MeV Cl ion beam irradiation was studied through analysis of Scanning Auger Microprobe ( SAM) and Secondary Ion Mass Spectroscopy ( SIMS).
本文通过用扫描俄歇微探针（SAM）和二次离子质谱（SIMS）分析了高能氯离子注入Cu／Si系统，对Cu薄膜附着力增强效应进行了研究。 - The distribution of trace elements as Fe, Si, Cu, Mg, Mn and Zn in the surface layer was also determined by secondary ion mass spectrometer.
利用二次离子质谱仪检测了铝箔表面区Fe、Si、Cu、Mg、Mn、Zn等微量元素的分布。 - Depth profile was studied using MCs+_ SIMS technique ( detection of MCs+ secondary ion under Cs+ primary ion bombardment) after the samples were annealed in high vacuum. The variation of interface composition with annealing temperature and time is given.
利用MCs＋－SIMS技术（在Cs＋一次离子轰击下检测MCs＋型二次离子）对样品进行了深度剖析，给出了界面组分分布随退火温度与时间的变化关系。 - In this article, the electronic packaging ceramic AlN samples from Department of Materials, Tsinghua university, have been studied using secondary ion mass spectrometry ( SIMS) and X-ray diffraction ( XRD).
用二次离子质谱（SIMS）和X射线衍射（XRD）对清华大学材料系电子封装用的AlN陶瓷进行了研究。 - Behaviors of As incorporation into HgCdTe in molecular beam epitaxy were studied and reported by using a SIMS ( Secondary Ion Mass Spectrometry) quantitative analysis.
报道了用二次离子质谱分析（SIMS）方法对As在碲镉汞分子束外延中的掺入行为的研究结果。 - Secondary ion mass spectrometry was used to measure the distribution of implanted depths of boron ions.
用二次离子质谱测量了注入硼离子的深度分布。 - An experiment was conducted to study the high-temperature annealing characteristics of polysilicon films using atomic force microscope, secondary ion mass spectroscopy and probe.
利用原子力显微镜、二次离子质谱分析仪和探针，对多晶硅薄膜的高温退火特性进行了实验研究。 - Study of Secondary ion Emission from GaAs under O_2 ￣+ and Cs ￣+ Ion Bombardment
砷化镓在O2~＋与Cs~＋离子轰击下二次离子发射的研究 - The FTE SAMs was characterized by the time-of-flight secondary ion mass spectrometer ( TOF-SIMS), atomic force microscopy ( AFM) and contact angle measurement, and the tribology properties of the FTE SAMs were measured by the Olympus head/ disk interface reliability measurement system.
应用时间飞行二次离子质谱仪（TOF-SIMS）、原子力显微镜（AFM）和接触角测量仪对FTE自组装膜进行表征。通过Olympus磁头磁盘界面可靠性测试系统对FTE自组装膜的摩擦学性能进行研究。 - Molecule-ion Cluster Formed in the Liquid Secondary Ion Mass Spectrometric Analysis of Phospholipids
磷脂液相二次离子质谱分析中的分子离子簇 - Deuterium oxide absorption distribution was measured by time of flight secondary ion mass spectroscopy ( ToF-SIMS).
采用飞行时间次级离子质谱分析法（TOF-SIMS）来测量重水吸收性分布。 - Optical, backscattered electron, secondary ion, and high-precision transmission electron microscope image analyses of samples containing moderate to high gold concentrations in sediment-hosted micro-disseminated gold deposits indicate that gold is strongly correlated with As on a microscopic scale.
对秦岭沉积岩为岩矿岩石的微细浸染型金矿床中-高含量金样品的光学、背散射电子、二次离子和高分辨透射电镜图象分析表明，金与砷具有显微尺度的强相关性。 - A high performance secondary ion analyzing system
高性能的二次离子分析系统